Localização de múltiplos danos no monitoramento de integridade estrutural por Impedância eletromecânica usando krigagem Indicadora

Abstract

Damage localization in Structural Health Monitoring (SHM) systems is a critical step, as it provides the essential information necessary for accurate interventions in the monitored system. Despite the development of several Electromechanical Impedance (EMI)-based methodologies, the identification of multiple damages remains largely unexplored, particularly in geometrically complex structures. In this context, this research proposes an Indicator Kriging (IK)-rooted framework for multi-damage location based on information derived from the EMI method. In order to illustrate the proposed approach, the present study investigates two structures: one with a basic geometry and another with a complex geometry. The latter represents an unprecedented scenario for applying the approach. Three distinct strategies for frequency interval selection are evaluated, and the results are analyzed in an integrative and comparative manner with recent methodologies. The findings underscore the potential of IK as a promising tool for robust localization of multiple damages, thereby pointing to relevant directions for the advancement of solutions applicable in real-scale industrial contexts.